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Testing for small-delay defects in nanoscale CMOS integrated circuits

Sandeep K. Goel

Testing for small-delay defects in nanoscale CMOS integrated circuits By: Goel, Sandeep K - New york CRC Press 2014 - xv, 247p.

ISBN: 9780367837389

Subjects--Topical Terms:
Electrical engineering

Dewey Class. No.: 621.39732 / GOE-T

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