Introduction to the characterization of residual stress by neutron diffraction / M.T. Hutchings ... [et al.].
Contributor(s): Hutchings, Michael T [Author]
| Withers, Philip J [Author] | Holden, Thomas M [Author] | Lorentzen, Torben [Author].
Material type: 
BookPublisher: Boca Raton, FL : Taylor & Francis, 2005Edition: Library Edition: Conceptual Physics.Description: 401 p. : ill. ; 25 cm.ISBN: 9780367899462 (Set); 9780367836481 (hbk).Subject(s): Neutron radiography | Residual stresses -- MeasurementDDC classification: 620.11230287
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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Reference
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RGU Central Library Reference | Reference | 620.11230287 INT-I (Browse shelf) | Not For Loan | 78037 |
Total holds: 0
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| 620.112 FAN-S Synchrotron radiation in materials science | 620.112 FAN-S Synchrotron radiation in materials science | 620.112 STA-M Micro structural randomness and scaling in mechanics of materials: | 620.11230287 INT-I Introduction to the characterization of residual stress by neutron diffraction / | 620.1124 ANA-A Analysis of residual stress by diffraction using neutron and synchrotron radiation / | 620.11295 VER-S Second-order nonlinear optical characterization techniques | 620.11295 XIE-N Nitride phosphors and solid-state lighting |
Includes bibliographical references and indexes.
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