TY  - BOOK
AU  - Sandeep K. Goel
TI  - Testing for small-delay defects in nanoscale CMOS integrated circuits
SN  - 9780367837389
U1  - 621.39732 
PY  - 2014///
CY  - New york
PB  - CRC Press
KW  - Electrical engineering
ER  -