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1. Analysis of residual stress by diffraction using neutron and synchrotron radiation / edited by M.E. Fitzpatrick and A. Lodini.

by Fitzpatrick, M. E. (Michael E.) [Editor] | Lodini, Alain [Editor].

Edition: Library Edition: Conceptual PhysicsMaterial type: book Book Publisher: London ; New York : Taylor & Francis, 2003Availability: Items available for reference: RGU Central Library [Call number: 620.1124 ANA-A] (1).

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2. Introduction to the characterization of residual stress by neutron diffraction / M.T. Hutchings ... [et al.].

by Hutchings, Michael T [Author] | Withers, Philip J [Author] | Holden, Thomas M [Author] | Lorentzen, Torben [Author].

Edition: Library Edition: Conceptual PhysicsMaterial type: book Book Publisher: Boca Raton, FL : Taylor & Francis, 2005Availability: Items available for reference: RGU Central Library [Call number: 620.11230287 INT-I] (1).

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