000 00904cam a22002534a 4500
999 _c81268
_d81268
003 OSt
005 20220709123425.0
020 _a9780367899462 (Set)
020 _a9780367836481 (hbk)
040 _aRGU
_cRGU
_dRGU
_bENGLISH
082 0 0 _a620.11230287
_bINT-I
245 0 0 _aIntroduction to the characterization of residual stress by neutron diffraction /
_cM.T. Hutchings ... [et al.].
250 _aLibrary Edition: Conceptual Physics
260 _aBoca Raton, FL :
_bTaylor & Francis,
_c2005.
300 _a401 p. :
_bill. ;
_c25 cm.
650 0 _aNeutron radiography.
_930668
650 0 _aResidual stresses
_xMeasurement.
_930678
700 1 _aHutchings, Michael T.
_eaut
_930679
700 1 _aWithers, Philip J.
_eaut
_930680
700 1 _aHolden, Thomas M.
_eaut
_930681
700 1 _aLorentzen, Torben
_eaut
_930682
504 _aIncludes bibliographical references and indexes.
942 _2ddc
_cREF