| 000 | 00477nam a22001697a 4500 | ||
|---|---|---|---|
| 999 |
_c82117 _d82117 |
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| 003 | OSt | ||
| 005 | 20230413111838.0 | ||
| 020 | _a9780367837389 | ||
| 040 | _bENGLISH | ||
| 082 |
_a621.39732 _bGOE-T |
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| 100 |
_aSandeep K. Goel _eedt _932510 |
||
| 245 |
_aTesting for small-delay defects in nanoscale CMOS integrated circuits _cBy: Goel, Sandeep K |
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| 260 |
_aNew york _bCRC Press _c2014 |
||
| 300 | _axv, 247p. | ||
| 650 |
_aElectrical engineering _912321 |
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| 942 |
_2ddc _cREF |
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